dc.contributor.author | Sharma, Rajiv | |
dc.contributor.author | Sivaramakrishnan Radhakrishnan, Hariharsudan | |
dc.contributor.author | Tous, Loic | |
dc.contributor.author | Poortmans, Jef | |
dc.date.accessioned | 2023-06-26T15:13:53Z | |
dc.date.available | 2023-06-20T10:34:59Z | |
dc.date.available | 2023-06-21T09:13:32Z | |
dc.date.available | 2023-06-26T15:13:53Z | |
dc.date.issued | 2022 | |
dc.identifier.issn | 0927-0248 | |
dc.identifier.other | WOS:000761250300002 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41871.3 | |
dc.source | WOS | |
dc.title | An electron-selective SiCy/SiOx contact for Si solar cells made with fully industrial techniques | |
dc.type | Journal article | |
dc.contributor.imecauthor | Sharma, Rajiv | |
dc.contributor.imecauthor | Sivaramakrishnan Radhakrishnan, Hariharsudan | |
dc.contributor.imecauthor | Tous, Loic | |
dc.contributor.imecauthor | Poortmans, Jef | |
dc.contributor.orcidimec | Tous, Loic::0000-0001-9928-7774 | |
dc.contributor.orcidimec | Poortmans, Jef::0000-0003-2077-2545 | |
dc.contributor.orcidimec | Sharma, Rajiv::0000-0002-6724-1437 | |
dc.contributor.orcidimec | Sivaramakrishnan Radhakrishnan, Hariharsudan::0000-0003-1963-273X | |
dc.identifier.doi | 10.1016/j.solmat.2022.111637 | |
dc.source.numberofpages | 8 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 111637-1 | |
dc.source.endpage | 111637-8 | |
dc.source.journal | SOLAR ENERGY MATERIALS AND SOLAR CELLS | |
dc.source.issue | May | |
dc.source.volume | 238 | |
imec.availability | Published - imec | |
dc.description.wosFundingText | The authors gratefully acknowledge the funding from the Kuwait Foundation for the Advancement of Sciences (KFAS) under the project number CN18-15 EE-01. Besides, we are thankful to the Material Characterization and Analysis group at IMEC for TEM/STEM-EDX and SIMS measurements, Devika Rajagopal for quantum efficiency mea-surements, Meric Firat for help with screen-printing, AlOx deposition, and technical discussions. We also thank the anonymous reviewers of this paper for their critical feedback. | |