dc.contributor.author | Wu, Cheng-Hung | |
dc.contributor.author | Ronchi, Nicolo | |
dc.contributor.author | Wang, Kuan-Chi | |
dc.contributor.author | Wang, Yu-Yun | |
dc.contributor.author | Mcmitchell, Sean | |
dc.contributor.author | Banerjee, Kaustuv | |
dc.contributor.author | van den Bosch, Geert | |
dc.contributor.author | van Houdt, Jan | |
dc.contributor.author | Wu, Tian-Li | |
dc.date.accessioned | 2023-06-29T14:47:15Z | |
dc.date.available | 2023-06-20T10:35:23Z | |
dc.date.available | 2023-06-29T14:47:15Z | |
dc.date.issued | 2022 | |
dc.identifier.issn | 2168-6734 | |
dc.identifier.other | WOS:000756799300019 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41885.2 | |
dc.source | WOS | |
dc.title | Impacts of Pulsing Schemes on the Endurance of Ferroelectric Metal-Ferroelectric-Insulator-Semiconductor Capacitors | |
dc.type | Journal article | |
dc.contributor.imecauthor | Ronchi, Nicolo | |
dc.contributor.imecauthor | Mcmitchell, Sean | |
dc.contributor.imecauthor | Banerjee, Kaustuv | |
dc.contributor.imecauthor | van den Bosch, Geert | |
dc.contributor.imecauthor | van Houdt, Jan | |
dc.contributor.orcidext | Wu, Cheng-Hung::0000-0002-7312-2370 | |
dc.contributor.orcidext | Wang, Kuan-Chi::0000-0001-8688-0990 | |
dc.contributor.orcidext | Wu, Tian-Li::0000-0001-6788-5470 | |
dc.contributor.orcidimec | Mcmitchell, Sean::0000-0002-9916-0973 | |
dc.contributor.orcidimec | van den Bosch, Geert::0000-0001-9971-6954 | |
dc.contributor.orcidimec | Ronchi, Nicolo::0000-0002-7961-4077 | |
dc.contributor.orcidimec | Banerjee, Kaustuv::0000-0001-8003-6211 | |
dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
dc.contributor.orcidimec | McMitchell, Sean::0000-0002-9916-0973 | |
dc.date.embargo | 2022-02-16 | |
dc.identifier.doi | 10.1109/JEDS.2022.3141756 | |
dc.source.numberofpages | 6 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 109 | |
dc.source.endpage | 114 | |
dc.source.journal | IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY | |
dc.source.issue | na | |
dc.source.volume | 10 | |
imec.availability | Published - open access | |
dc.description.wosFundingText | This work was supported in part by the "Center for the Semiconductor Technology Research" from The Featured Areas Research Center Program within the framework of the Higher Education Sprout Project by the Ministry of Education (MOE) in Taiwan; in part by the Ministry of Science and Technology, Taiwan, under Grant MOST 110-2634-F-009-027 and Grant MOST 110-2622-8-009-018-SB; and in part by the Young Scholar Fellowship Program under Grant MOST 110-2636-E-009-023. | |