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dc.contributor.authorKim, Jaenam
dc.contributor.authorKim, Joo Hyoung
dc.contributor.authorChang, Yun-Tzu
dc.contributor.authorPark, Jihoon
dc.contributor.authorJin, Minhyun
dc.contributor.authorPejovic, Vladimir
dc.contributor.authorGeorgitzikis, Epimitheas
dc.contributor.authorThijs, Steven
dc.contributor.authorLieberman, Itai
dc.contributor.authorLi, Yunlong
dc.contributor.authorHeremans, Paul
dc.contributor.authorMalinowski, Pawel
dc.contributor.authorChun, Jung-Hoon
dc.contributor.authorLee, Jiwon
dc.date.accessioned2023-11-23T14:39:48Z
dc.date.available2023-06-24T19:58:58Z
dc.date.available2023-11-23T14:39:48Z
dc.date.issued2023
dc.identifier.issn0018-9383
dc.identifier.otherWOS:000988398800001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/42085.2
dc.sourceWOS
dc.titleInvestigation of the Global Shutter Operation of the Quantum-Dot Short-Wave Infrared Image Sensor
dc.typeJournal article
dc.contributor.imecauthorKim, Jaenam
dc.contributor.imecauthorChang, Yun-Tzu
dc.contributor.imecauthorJin, Minhyun
dc.contributor.imecauthorPejovic, Vladimir
dc.contributor.imecauthorGeorgitzikis, Epimitheas
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorLieberman, Itai
dc.contributor.imecauthorLi, Yunlong
dc.contributor.imecauthorHeremans, Paul
dc.contributor.imecauthorMalinowski, Pawel
dc.contributor.imecauthorLee, Jiwon
dc.contributor.imecauthorKim, Joo Hyoung
dc.contributor.orcidimecChang, Yun-Tzu::0000-0002-6897-5926
dc.contributor.orcidimecPejovic, Vladimir::0000-0003-4823-1206
dc.contributor.orcidimecGeorgitzikis, Epimitheas::0000-0001-5972-8328
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.contributor.orcidimecLieberman, Itai::0000-0002-5188-6652
dc.contributor.orcidimecLi, Yunlong::0000-0003-4791-4013
dc.contributor.orcidimecHeremans, Paul::0000-0003-2151-1718
dc.contributor.orcidimecMalinowski, Pawel::0000-0002-2934-470X
dc.contributor.orcidimecLee, Jiwon::0000-0003-3738-4872
dc.contributor.orcidimecKim, Joo Hyoung::0000-0002-2118-596X
dc.identifier.doi10.1109/TED.2023.3269734
dc.source.numberofpages5
dc.source.peerreviewyes
dc.source.beginpage3155
dc.source.endpage3159
dc.source.journalIEEE TRANSACTIONS ON ELECTRON DEVICES
dc.source.issue6
dc.source.volume70
imec.availabilityPublished - imec
dc.description.wosFundingTextThis work was supported by the Ministry of Trade, Industry, and Energy (MOTIE), Republic of Korea, under the Fostering Global Talents for Innovative Growth Program under Grant P0017312, supervised by the Korea Institute for Advancement of Technology (KIAT). The review of this article was arranged by Editor L. Pancheri.


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