dc.contributor.author | Lomenzo, Patrick D. D. | |
dc.contributor.author | Celano, Umberto | |
dc.contributor.author | Kaempfe, Thomas | |
dc.contributor.author | McMitchell, Sean | |
dc.date.accessioned | 2023-08-09T09:33:45Z | |
dc.date.available | 2023-06-30T21:08:50Z | |
dc.date.available | 2023-08-09T09:33:45Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | 2673-3013 | |
dc.identifier.other | WOS:000993463300001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42109.2 | |
dc.source | WOS | |
dc.title | Advanced characterization methods for HfO2/ZrO2-based ferroelectrics | |
dc.type | Editorial material | |
dc.contributor.imecauthor | Celano, Umberto | |
dc.contributor.imecauthor | McMitchell, Sean | |
dc.contributor.orcidimec | Celano, Umberto::0000-0002-2856-3847 | |
dc.contributor.orcidimec | McMitchell, Sean::0000-0002-9916-0973 | |
dc.date.embargo | 2023-01-23 | |
dc.identifier.doi | 10.3389/fnano.2023.1114267 | |
dc.source.numberofpages | 2 | |
dc.source.peerreview | no | |
dc.source.beginpage | Art. 1114267 | |
dc.source.endpage | na | |
dc.source.journal | FRONTIERS IN NANOTECHNOLOGY | |
dc.source.issue | / | |
dc.source.volume | 5 | |
imec.availability | Published - open access | |