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dc.contributor.authorChen, Bin
dc.contributor.authorZhai, Zhaofeng
dc.contributor.authorHuang, Nan
dc.contributor.authorZhang, Chuyan
dc.contributor.authorYu, Siyu
dc.contributor.authorLiu, Lusheng
dc.contributor.authorYang, Bing
dc.contributor.authorJiang, Xin
dc.contributor.authorYang, Nianjun
dc.date.accessioned2024-02-01T09:39:16Z
dc.date.available2023-08-21T18:00:49Z
dc.date.available2024-02-01T09:39:16Z
dc.date.issued2023
dc.identifier.issn1614-6832
dc.identifier.otherWOS:001044772400001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/42379.2
dc.sourceWOS
dc.titleHighly Localized Charges of Confined Electrical Double-Layers Inside 0.7-nm Layered Channels
dc.typeJournal article
dc.identifier.doi10.1002/aenm.202300716
dc.source.numberofpages11
dc.source.peerreviewyes
dc.source.beginpageArt. 2300716
dc.source.endpageN/A
dc.source.journalADVANCED ENERGY MATERIALS
dc.source.issue36
dc.source.volume13
imec.availabilityPublished - imec
dc.description.wosFundingTextThe authors thank for Prof. Zhongshuai Wu in Dalian Institute of Chemical Physics, Chinese Academy of Sciences and Prof. Bingsen Zhang in Institute of Metal Research, Chinese Academy of Sciences for the discussion of the electrical double-layer capacitance. This work was supported by the National Natural Science Foundation of China (No. 51202257) and N. Y. thanks the financial support from Deutsche Forschungsgemeinschaft (DFG, German Research Foundation, No. 457444676).


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