dc.contributor.author | Werthen Brabants, Lorin | |
dc.contributor.author | Dhaene, Tom | |
dc.contributor.author | Deschrijver, Dirk | |
dc.date.accessioned | 2023-11-08T10:15:53Z | |
dc.date.available | 2023-10-18T17:24:31Z | |
dc.date.available | 2023-10-19T08:42:50Z | |
dc.date.available | 2023-11-08T10:15:53Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | 0013-5194 | |
dc.identifier.other | WOS:001076347400001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42815.3 | |
dc.source | WOS | |
dc.title | Reliable assessment of uncertainty for appliance recognition in NILM using conformal prediction | |
dc.type | Journal article | |
dc.contributor.imecauthor | Werthen Brabants, Lorin | |
dc.contributor.imecauthor | Dhaene, Tom | |
dc.contributor.imecauthor | Deschrijver, Dirk | |
dc.contributor.orcidimec | Dhaene, Tom::0000-0003-2899-4636 | |
dc.contributor.orcidimec | Deschrijver, Dirk::0000-0001-6600-1792 | |
dc.contributor.orcidimec | Werthen Brabants, Lorin::0000-0001-9976-1886 | |
dc.date.embargo | 2023-09-24 | |
dc.identifier.doi | 10.1049/ell2.12860 | |
dc.source.numberofpages | 3 | |
dc.source.peerreview | yes | |
dc.source.beginpage | Art. e12860 | |
dc.source.endpage | na | |
dc.source.journal | ELECTRONICS LETTERS | |
dc.source.issue | 18 | |
dc.source.volume | 59 | |
imec.availability | Published - open access | |
dc.description.wosFundingText | This research received funding from the Flemish Government under the "Onderzoeksprogramma Artificiele Intelligentie (AI) Vlaanderen" programme. | |