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dc.contributor.authorWerthen Brabants, Lorin
dc.contributor.authorDhaene, Tom
dc.contributor.authorDeschrijver, Dirk
dc.date.accessioned2023-11-08T10:15:53Z
dc.date.available2023-10-18T17:24:31Z
dc.date.available2023-10-19T08:42:50Z
dc.date.available2023-11-08T10:15:53Z
dc.date.issued2023
dc.identifier.issn0013-5194
dc.identifier.otherWOS:001076347400001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/42815.3
dc.sourceWOS
dc.titleReliable assessment of uncertainty for appliance recognition in NILM using conformal prediction
dc.typeJournal article
dc.contributor.imecauthorWerthen Brabants, Lorin
dc.contributor.imecauthorDhaene, Tom
dc.contributor.imecauthorDeschrijver, Dirk
dc.contributor.orcidimecDhaene, Tom::0000-0003-2899-4636
dc.contributor.orcidimecDeschrijver, Dirk::0000-0001-6600-1792
dc.contributor.orcidimecWerthen Brabants, Lorin::0000-0001-9976-1886
dc.date.embargo2023-09-24
dc.identifier.doi10.1049/ell2.12860
dc.source.numberofpages3
dc.source.peerreviewyes
dc.source.beginpageArt. e12860
dc.source.endpagena
dc.source.journalELECTRONICS LETTERS
dc.source.issue18
dc.source.volume59
imec.availabilityPublished - open access
dc.description.wosFundingTextThis research received funding from the Flemish Government under the "Onderzoeksprogramma Artificiele Intelligentie (AI) Vlaanderen" programme.


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