dc.contributor.author | Tang, Hongwei | |
dc.contributor.author | Dekkers, Harold | |
dc.contributor.author | Rassoul, Nouredine | |
dc.contributor.author | Sutar, Surajit | |
dc.contributor.author | Subhechha, Subhali | |
dc.contributor.author | Afanasiev, Valeri | |
dc.contributor.author | Van Houdt, Jan | |
dc.contributor.author | Delhougne, Romain | |
dc.contributor.author | Kar, Gouri Sankar | |
dc.contributor.author | Belmonte, Attilio | |
dc.date.accessioned | 2024-01-24T11:35:12Z | |
dc.date.available | 2023-12-24T17:38:20Z | |
dc.date.available | 2024-01-24T11:35:12Z | |
dc.date.issued | 2024 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.other | WOS:001109200800001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/43293.2 | |
dc.source | WOS | |
dc.title | Study of Contact Resistance Components in Short-Channel Indium-Gallium-Zinc-Oxide Transistor | |
dc.type | Journal article | |
dc.contributor.imecauthor | Tang, Hongwei | |
dc.contributor.imecauthor | Dekkers, Harold | |
dc.contributor.imecauthor | Rassoul, Nouredine | |
dc.contributor.imecauthor | Sutar, Surajit | |
dc.contributor.imecauthor | Subhechha, Subhali | |
dc.contributor.imecauthor | Van Houdt, Jan | |
dc.contributor.imecauthor | Delhougne, Romain | |
dc.contributor.imecauthor | Kar, Gouri Sankar | |
dc.contributor.imecauthor | Belmonte, Attilio | |
dc.contributor.imecauthor | Afanasiev, Valeri | |
dc.contributor.orcidimec | Tang, Hongwei::0009-0005-1345-5551 | |
dc.contributor.orcidimec | Dekkers, Harold::0000-0003-4778-5709 | |
dc.contributor.orcidimec | Rassoul, Nouredine::0000-0001-9489-3396 | |
dc.contributor.orcidimec | Sutar, Surajit::0000-0003-3114-718X | |
dc.contributor.orcidimec | Subhechha, Subhali::0000-0002-1960-5136 | |
dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
dc.contributor.orcidimec | Belmonte, Attilio::0000-0002-3947-1948 | |
dc.contributor.orcidimec | Delhougne, Romain::0009-0009-0129-709X | |
dc.contributor.orcidimec | Afanasiev, Valeri::0000-0001-5018-4539 | |
dc.identifier.doi | 10.1109/TED.2023.3332057 | |
dc.source.numberofpages | 7 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 567 | |
dc.source.endpage | 573 | |
dc.source.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | |
dc.source.issue | 1 | |
dc.source.volume | 71 | |
imec.availability | Published - imec | |