dc.contributor.author | Guo, Zixiang | |
dc.contributor.author | Li, Kan | |
dc.contributor.author | Li, Xun | |
dc.contributor.author | Luo, Xuyi | |
dc.contributor.author | Zhang, En Xia | |
dc.contributor.author | Reed, Robert A. | |
dc.contributor.author | Schrimpf, Ronald D. | |
dc.contributor.author | Fleetwood, Daniel M. | |
dc.contributor.author | Vaisman Chasin, Adrian | |
dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | Linten, Dimitri | |
dc.date.accessioned | 2024-04-25T14:22:35Z | |
dc.date.available | 2024-01-08T17:19:11Z | |
dc.date.available | 2024-04-25T14:22:35Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | 0018-9499 | |
dc.identifier.other | WOS:001116676600064 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/43366.2 | |
dc.source | WOS | |
dc.title | Total-Ionizing-Dose Effects in IGZO Thin-Film Transistors | |
dc.type | Journal article | |
dc.contributor.imecauthor | Vaisman Chasin, Adrian | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.orcidimec | Vaisman Chasin, Adrian::0000-0002-9940-0260 | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.identifier.doi | 10.1109/TNS.2023.3280432 | |
dc.source.numberofpages | 6 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 2002 | |
dc.source.endpage | 2007 | |
dc.source.journal | IEEE TRANSACTIONS ON NUCLEAR SCIENCE | |
dc.source.issue | 8 | |
dc.source.volume | 70 | |
imec.availability | Published - imec | |
dc.description.wosFundingText | This work was supported by the Air Force Center of Excellence in Radiation Effects under Award FA9550-22-1-0012. | |