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The ESD Protection Mechanisms and Related Failure Modes and Mechanisms Observed in SOI nMOSFET's

dc.contributor.authorVerhaege, K.
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorColinge, Jean-Pierre
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-09-29T12:51:50Z
dc.date.available2021-09-29T12:51:50Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/435
dc.sourceIIOimport
dc.titleThe ESD Protection Mechanisms and Related Failure Modes and Mechanisms Observed in SOI nMOSFET's
dc.typeJournal article
dc.contributor.imecauthorGroeseneken, Guido
dc.source.peerreviewno
dc.source.beginpage555
dc.source.endpage556
dc.source.journalMicroelectronics and Reliability
dc.source.volume35
imec.availabilityPublished - imec


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