Browsing Articles by imec author "63542b50524986812200512fe6e089756b61c4f3"
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Defect profiling in FEFET Si:HfO2 layers
O'Sullivan, Barry; Putcha, Vamsi; Izmailov, Roman; Afanas'ev, Valeri V.; Simoen, Eddy; Jung, Taehwan; Higashi, Yusuke; Degraeve, Robin; Truijen, Brecht; Kaczer, Ben; Ronchi, Nicolo; McMitchell, Sean; Banerjee, Kaustuv; Clima, Sergiu; Breuil, Laurent; Van den Bosch, Geert; Linten, Dimitri; Van Houdt, Jan (2020) -
Impact of Interface Layer on Device Characteristics of Si:HfO2-Based FeFET's
Jung, Taehwan; O'Sullivan, Barry J.; Ronchi, Nicolo; Linten, Dimitri; Shin, Changhwan; Van Houdt, Jan (2021)