Browsing by author "Quaeyhaegens, D."
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Lateral and vertical dopant profiling in semiconductors by atomic force microscopy using conducting tips
De Wolf, Peter; Snauwaert, Johan; Hellemans, L.; Clarysse, Trudo; Vandervorst, Wilfried; D'Olieslaeger, Marc; Quaeyhaegens, D. (1995)