Browsing by author "Min, Jinhong"
Now showing items 1-2 of 2
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Endurance of ferroelectric La-doped HfO2 for SFS gate-stack memory devices
Ronchi, Nicolo; McMitchell, Sean; Min, Jinhong; Banerjee, Kaustuv; Van den Bosch, Geert; Shin, Changhwan; Van Houdt, Jan (2020) -
Program/Erase Scheme for Suppressing Interface Trap Generation in HfO2-Based Ferroelectric Field Effect Transistor
Min, Jinhong; Ronchi, Nicolo; O'Sullivan, Barry; Banerjee, Kaustuv; Van den Bosch, Geert; Van Houdt, Jan; Shin, Changhwan; McMitchell, Sean (2021)