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Program/Erase Scheme for Suppressing Interface Trap Generation in HfO2-Based Ferroelectric Field Effect Transistor
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Authors
Min, Jinhong
;
Ronchi, Nicolo
;
O'Sullivan, Barry
;
Banerjee, Kaustuv
;
Van den Bosch, Geert
;
Van Houdt, Jan
;
Shin, Changhwan
;
McMitchell, Sean
DOI
10.1109/LED.2021.3102592
ISSN
0741-3106
Issue
9
Journal
IEEE ELECTRON DEVICE LETTERS
Volume
42
Research discipline
Engineering
Title
Program/Erase Scheme for Suppressing Interface Trap Generation in HfO2-Based Ferroelectric Field Effect Transistor
Publication type
Journal article
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3
20.500.12860/37611.3
*
2022-03-31T12:05:13Z
validation by library/open access desk
2
20.500.12860/37611.2
2021-12-06T08:34:04Z
validation by imec author
1
20.500.12860/37611
2021-11-02T15:57:28Z
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