Browsing by author "Van den Bosch, Geert"
Now showing items 1-20 of 204
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3D measurement of 3D NAND memory hole with CD-SEM and tilted FIB
Ohashi, Takeyoshi; Yamaguchi, Atsuko; Hasumi, Kazuhisa; Ikota, Masami; Tan, Chi Lim; Raymaekers, Tom; Van den Bosch, Geert; Furnemont, Arnaud; Lorusso, Gian (2017) -
3D TCAD model for poly-Si channel current and variability in vertical NAND flash memory
Verreck, Devin; Arreghini, Antonio; Schanovsky, Franz; Stanojevic, Zlatan; Steiner, K.; Mitterbauer, F.; Karner, Markus; Van den Bosch, Geert; Furnemont, Arnaud (2019) -
A comprehensive closed-form model for the quantized accumulation layer in MOS structures
Kol'dyaev, Victor; Van den Bosch, Geert; Deferm, Ludo (1998) -
A comprehensive understanding of the erase of TANOS memories through charge separation experiments and simulations
Padovani, Andrea; Arreghini, Antonio; Vandelli, Luca; Larcher, Luca; Van den Bosch, Geert; Pavan, Paolo; Van Houdt, Jan (2011) -
A comprehensive variability study of doped HfO2 FeFET for memory applications
Ronchi, Nicolo; Ragnarsson, Lars-Ake; Celano, Umberto; Kaczer, Ben; Kaczmarek, Jakub; Banerjee, Kaustuv; McMitchell, Sean; Van den Bosch, Geert; Van Houdt, Jan (2022) -
A fast and flexible thermal simulation tool validated on smart power devices
Desoete, B.; Moens, P.; Driessens, Evelien; Elattari, Brahim; Van den Bosch, Geert; Gillon, R.; Groeseneken, Guido (2005-05) -
A methodology for mechanical stress and wafer warpage minimization during 3D NAND fabrication
Kruv, Anastasiia; Gonzalez, Mario; Okudur, Oguzhan Orkut; Spampinato, Valentina; Franquet, Alexis; Vadakupudhu Palayam, Senthil; Arreghini, Antonio; Van den Bosch, Geert; Rosmeulen, Maarten; De Wolf, Ingrid (2022) -
A novel multilayer inter-gate dielectric enabling up To 18V program / erase window for planar NAND flash
Breuil, Laurent; Lisoni, Judit; Blomme, Pieter; Van den Bosch, Geert; Van Houdt, Jan (2013-05) -
A Novel Ni-Al Alloy Metal Induced Lateral Crystallization Process for Improved Channel Conduction in 3-D NAND Flash
Ramesh, Siva; Banerjee, Kaustuv; Opsomer, Karl; Rachita, Iuliana; Bastos, Joao; Soulie, Jean-Philippe; Sebaai, Farid; Favia, Paola; Korytov, Maxim; Richard, Olivier; Breuil, Laurent; Arreghini, Antonio; Van den Bosch, Geert; Rosmeulen, Maarten (2022) -
A novel PEALD tunnel dielectric for three-dimensional non-volatile charge-trapping technology
Cacciato, Antonio; Breuil, Laurent; Dekkers, Harold; Zahid, Mohammed; Kar, Gouri Sankar; Everaert, Jean-Luc; Schoofs, Geert; Shi, Qixian; Van den Bosch, Geert; Jurczak, Gosia; Debusschere, Ingrid; Van Houdt, Jan; Cockburn, Andrew; Date, Lucien; Xa, Li Qun; Le, Maggie; Lee, Won (2011) -
A novel PEALD tunnel dielectric for three-dimensional non-volatile charge-trapping technology
Cacciato, Antonio; Breuil, Laurent; Dekkers, Harold; Zahid, Mohammed; Kar, Gouri Sankar; Everaert, Jean-Luc; Schoofs, Geert; Van den Bosch, Geert; Jurczak, Gosia; Debusschere, Ingrid; Van Houdt, Jan; Cockburn, Andrew; Date, Lucien; Xa, Li-Qun; Le, Maggie; Lee, Won (2010) -
A proper approach to characterize retention-after-cycling in 3D-Flash devices
Qiao, Fengying; Arreghini, Antonio; Blomme, Pieter; Van den Bosch, Geert; Pan, Liyang; Xu, Jun; Van Houdt, Jan (2013) -
A unified hot carrier degradation model for integrated lateral and vertical nDMOS transistors
Moens, P.; Van den Bosch, Geert; Groeseneken, Guido; Bolognesi, D. (2003) -
Abnormal VTH/VFB shift caused by as-grown mobile charges in Al2O3 and its impacts on Flash memory cell operations
Tang, Baojun; Zhang, Weidong; Zhang, Jianfu; Van den Bosch, Geert; Govoreanu, Bogdan; Van Houdt, Jan (2011) -
An inner gate as enabler for vertical pitch scaling in macaroni channel gate-all-around 3-D NAND flash memory
Verreck, Devin; Arreghini, Antonio; Van den Bosch, Geert; Rosmeulen, Maarten (2023) -
Analysing antenna ratio dependence of plasma charging damage with Weibull breakdown statistics
Van den Bosch, Geert; Creusen, Martin; Degraeve, Robin; Kaczer, Ben; Groeseneken, Guido (2000) -
Analysis and application of energy capability characterization methods in power MOSFETs
Van den Bosch, Geert; Moens, Peter; Gassot, Pierre; Wojchiechowski, Dominique; Groeseneken, Guido (2004) -
Analysis of performance/variability trade-off in Macaroni-type 3-D NAND Memory
Congedo, Gabriele; Arreghini, Antonio; Liu, Lifang; Capogreco, Elena; Lisoni, Judit; Huet, Karim; Toque-Tresonne, Ines; Van Aerde, Steven; Toledano Luque, Maria; Tan, Chi Lim; Van den Bosch, Geert; Van Houdt, Jan (2014) -
Analysis of plasma induced gate oxide damage in multi-level metal processing
Yuan, Xiao Jie; Van den Bosch, Geert; Lietaer, Nicolas; Zagrebnov, Maxim; Debusschere, Ingrid; Deferm, Ludo (1998) -
Anomalously weak antenna ratio dependence of plasma process-induced damage
Van den Bosch, Geert; Creusen, Martin; Degraeve, Robin; Kaczer, Ben; Groeseneken, Guido (2000)