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A novel multilayer inter-gate dielectric enabling up To 18V program / erase window for planar NAND flash
Publication:
A novel multilayer inter-gate dielectric enabling up To 18V program / erase window for planar NAND flash
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Date
2013-05
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Breuil, Laurent
;
Lisoni, Judit
;
Blomme, Pieter
;
Van den Bosch, Geert
;
Van Houdt, Jan
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1924
since deposited on 2021-10-21
Acq. date: 2025-12-10
Citations
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Views
1924
since deposited on 2021-10-21
Acq. date: 2025-12-10
Citations