A proper approach to characterize retention-after-cycling in 3D-Flash devices

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Authors
Qiao, Fengying; Arreghini, Antonio; Blomme, Pieter; Van den Bosch, Geert; Pan, Liyang; Xu, Jun; Van Houdt, Jan
Conference
International Conference on Microelectronics Test Structures - ICMTS
Title
A proper approach to characterize retention-after-cycling in 3D-Flash devices
Publication type
Proceedings paper
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