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A proper approach to characterize retention-after-cycling in 3D-Flash devices
Publication:
A proper approach to characterize retention-after-cycling in 3D-Flash devices
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Date
2013
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Qiao, Fengying
;
Arreghini, Antonio
;
Blomme, Pieter
;
Van den Bosch, Geert
;
Pan, Liyang
;
Xu, Jun
;
Van Houdt, Jan
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1946
since deposited on 2021-10-21
1
last month
Acq. date: 2025-12-10
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Metrics
Views
1946
since deposited on 2021-10-21
1
last month
Acq. date: 2025-12-10
Citations