Authors

Tang, Baojun; Zhang, Weidong; Zhang, Jianfu; Van den Bosch, Geert; Govoreanu, Bogdan; Van Houdt, Jan

Conference

IEEE International Electron Devices Meeting - IEDM

Title

Abnormal VTH/VFB shift caused by as-grown mobile charges in Al2O3 and its impacts on Flash memory cell operations

Publication type

Proceedings paper