Publication:
Abnormal VTH/VFB shift caused by as-grown mobile charges in Al2O3 and its impacts on Flash memory cell operations
Date
| dc.contributor.author | Tang, Baojun | |
| dc.contributor.author | Zhang, Weidong | |
| dc.contributor.author | Zhang, Jianfu | |
| dc.contributor.author | Van den Bosch, Geert | |
| dc.contributor.author | Govoreanu, Bogdan | |
| dc.contributor.author | Van Houdt, Jan | |
| dc.contributor.imecauthor | Van den Bosch, Geert | |
| dc.contributor.imecauthor | Govoreanu, Bogdan | |
| dc.contributor.imecauthor | Van Houdt, Jan | |
| dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
| dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
| dc.date.accessioned | 2021-10-19T19:29:59Z | |
| dc.date.available | 2021-10-19T19:29:59Z | |
| dc.date.issued | 2011 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19866 | |
| dc.source.beginpage | 219 | |
| dc.source.conference | IEEE International Electron Devices Meeting - IEDM | |
| dc.source.conferencedate | 5/12/2011 | |
| dc.source.conferencelocation | Washington, DC USA | |
| dc.source.endpage | 222 | |
| dc.title | Abnormal VTH/VFB shift caused by as-grown mobile charges in Al2O3 and its impacts on Flash memory cell operations | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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