Publication:
A unified hot carrier degradation model for integrated lateral and vertical nDMOS transistors
Date
Loading...
Journal
Abstract
Description
Metrics
Views
2021 since deposited on 2021-10-15
1last week
Acq. date: 2025-10-29
Citations
Metrics
Views
2021 since deposited on 2021-10-15
1last week
Acq. date: 2025-10-29
Citations