Publication:

A comprehensive variability study of doped HfO2 FeFET for memory applications

Date

2022
Proceedings Paper
https://doi.org/10.1109/IMW52921.2022.9779294
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Author(s)

Ronchi, Nicolo  
;
Ragnarsson, Lars-Ake  
;
Celano, Umberto  
;
Kaczer, Ben  
;
Kaczmarek, Jakub  
;
Banerjee, Kaustuv  
;
McMitchell, Sean  
;
Van den Bosch, Geert  
;
Van Houdt, Jan  

Journal

na

Abstract

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1380 since deposited on 2023-06-15
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Acq. date: 2025-10-24

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