Publication:

A comprehensive variability study of doped HfO2 FeFET for memory applications

Date

2022

Proceedings Paper

https://doi.org/10.1109/IMW52921.2022.9779294

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Author(s)

;

Ragnarsson, Lars-Ake

;

Celano, Umberto

;

;

Kaczmarek, Jakub

;

Banerjee, Kaustuv

;

McMitchell, Sean

;

Van den Bosch, Geert

;

Journal

na

Metrics

1385 since deposited on 2023-06-15

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Acq. date: 2026-01-09