Publication:
A comprehensive variability study of doped HfO2 FeFET for memory applications
| dc.contributor.author | Ronchi, Nicolo | |
| dc.contributor.author | Ragnarsson, Lars-Ake | |
| dc.contributor.author | Celano, Umberto | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | Kaczmarek, Jakub | |
| dc.contributor.author | Banerjee, Kaustuv | |
| dc.contributor.author | McMitchell, Sean | |
| dc.contributor.author | Van den Bosch, Geert | |
| dc.contributor.author | Van Houdt, Jan | |
| dc.contributor.imecauthor | Ronchi, Nicolo | |
| dc.contributor.imecauthor | Ragnarsson, Lars-Ake | |
| dc.contributor.imecauthor | Celano, Umberto | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.imecauthor | Kaczmarek, Jakub | |
| dc.contributor.imecauthor | Banerjee, Kaustuv | |
| dc.contributor.imecauthor | McMitchell, Sean | |
| dc.contributor.imecauthor | Van den Bosch, Geert | |
| dc.contributor.imecauthor | Van Houdt, Jan | |
| dc.contributor.orcidimec | Kaczer, B.::0000-0002-1484-4007 | |
| dc.contributor.orcidimec | McMitchell, S. R. C.::0000-0002-9916-0973 | |
| dc.contributor.orcidimec | Ronchi, Nicolo::0000-0002-7961-4077 | |
| dc.contributor.orcidimec | Ragnarsson, Lars-Ake::0000-0003-1057-8140 | |
| dc.contributor.orcidimec | Celano, Umberto::0000-0002-2856-3847 | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.contributor.orcidimec | Banerjee, Kaustuv::0000-0001-8003-6211 | |
| dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
| dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
| dc.date.accessioned | 2023-06-15T14:06:47Z | |
| dc.date.available | 2023-06-15T14:06:47Z | |
| dc.date.issued | 2022 | |
| dc.identifier.doi | 10.1109/IMW52921.2022.9779294 | |
| dc.identifier.eisbn | 978-1-6654-9947-7 | |
| dc.identifier.issn | 2330-7978 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41736 | |
| dc.publisher | IEEE | |
| dc.source.beginpage | 85 | |
| dc.source.conference | 14th IEEE International Memory Workshop (IMW) | |
| dc.source.conferencedate | MAR 15-18, 2022 | |
| dc.source.conferencelocation | Dresden | |
| dc.source.endpage | 88 | |
| dc.source.journal | na | |
| dc.source.numberofpages | 4 | |
| dc.title | A comprehensive variability study of doped HfO2 FeFET for memory applications | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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