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A comprehensive understanding of the erase of TANOS memories through charge separation experiments and simulations
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A comprehensive understanding of the erase of TANOS memories through charge separation experiments and simulations
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Date
2011
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Padovani, Andrea
;
Arreghini, Antonio
;
Vandelli, Luca
;
Larcher, Luca
;
Van den Bosch, Geert
;
Pavan, Paolo
;
Van Houdt, Jan
Journal
IEEE Transactions on Electron Devices
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1979
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Acq. date: 2025-12-10
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Views
1979
since deposited on 2021-10-19
2
last month
1
last week
Acq. date: 2025-12-10
Citations