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A comprehensive understanding of the erase of TANOS memories through charge separation experiments and simulations
Publication:
A comprehensive understanding of the erase of TANOS memories through charge separation experiments and simulations
Date
2011
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Padovani, Andrea
;
Arreghini, Antonio
;
Vandelli, Luca
;
Larcher, Luca
;
Van den Bosch, Geert
;
Pavan, Paolo
;
Van Houdt, Jan
Journal
IEEE Transactions on Electron Devices
Abstract
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1977
since deposited on 2021-10-19
423
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
1977
since deposited on 2021-10-19
423
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations