Authors

Padovani, Andrea; Arreghini, Antonio; Vandelli, Luca; Larcher, Luca; Van den Bosch, Geert; Pavan, Paolo; Van Houdt, Jan

ISSN

0018-9383

Issue

9

Journal

IEEE Transactions on Electron Devices

Volume

58

Title

A comprehensive understanding of the erase of TANOS memories through charge separation experiments and simulations

Publication type

Journal article

Embargo date

9999-12-31