A comprehensive understanding of the erase of TANOS memories through charge separation experiments and simulations

dc.contributor.author	Padovani, Andrea
dc.contributor.author	Arreghini, Antonio
dc.contributor.author	Vandelli, Luca
dc.contributor.author	Larcher, Luca
dc.contributor.author	Van den Bosch, Geert
dc.contributor.author	Pavan, Paolo
dc.contributor.author	Van Houdt, Jan
dc.contributor.imecauthor	Arreghini, Antonio
dc.contributor.imecauthor	Van den Bosch, Geert
dc.contributor.imecauthor	Van Houdt, Jan
dc.contributor.orcidimec	Arreghini, Antonio::0000-0002-7493-9681
dc.contributor.orcidimec	Van den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimec	Van Houdt, Jan::0000-0003-1381-6925
dc.date.accessioned	2021-10-19T17:02:11Z
dc.date.available	2021-10-19T17:02:11Z
dc.date.embargo	9999-12-31
dc.date.issued	2011
dc.identifier.issn	0018-9383
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/19531
dc.source.beginpage	3147
dc.source.endpage	3155
dc.source.issue	9
dc.source.journal	IEEE Transactions on Electron Devices
dc.source.volume	58
dc.title	A comprehensive understanding of the erase of TANOS memories through charge separation experiments and simulations
dc.type	Journal article
dspace.entity.type	Publication
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