Browsing by author "Van den Bosch, Geert"
Now showing items 21-40 of 202
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Application of single pulse dynamics to model program anderase cycling-induced defects in the tunnel oxide of charge-trapping devices
Bastos, Joao; Arreghini, Antonio; Verreck, Devin; Schanovsky, Franz; Degraeve, Robin; Linten, Dimitri; Van den Bosch, Geert; Furnemont, Arnaud (2019) -
Assessment methodology of the lateral migration component in data retention of 3D SONOS memories
Liu, Lifang; Arreghini, Antonio; Van den Bosch, Geert; Liyang, Pan; Van Houdt, Jan (2014) -
Assessment of oxide reliability and hot carrier degradation in CMOS technology
Maes, Herman; Groeseneken, Guido; Degraeve, Robin; De Blauwe, Jan; Van den Bosch, Geert (1998) -
Assessment of tunnel oxide and poly-Si channel traps in 3D SONOS memory before and after P/E cycling
Lee, Ko-Hui; Degraeve, Robin; Toledano Luque, Maria; Arreghini, Antonio; Breuil, Laurent; Blomme, Pieter; Van den Bosch, Geert; Van Houdt, Jan (2015) -
At the Extreme of 3D-NAND Scaling: 25 nm Z-Pitch with 10 nm Word Line Cells
Rachidi, Sana; Arreghini, Antonio; Verreck, Devin; Donadio, Gabriele Luca; Banerjee, Kaustuv; Katcko, Kostantine; Oniki, Yusuke; Van den Bosch, Geert; Rosmeulen, Maarten (2022) -
Atomic layer deposition of scandium-based oxides
Nyns, Laura; Lisoni, Judit; Van den Bosch, Geert; Van Elshocht, Sven; Van Houdt, Jan (2013) -
Atomic layer deposition of scandium-based oxides
Nyns, Laura; Lisoni, Judit; Van den Bosch, Geert; Van Elshocht, Sven; Van Houdt, Jan (2013) -
Atomic layer deposition of scandium-based oxides
Nyns, Laura; Lisoni, Judit; Van den Bosch, Geert; Van Elshocht, Sven; Van Houdt, Jan (2014) -
Band edge work function metal gates using PEALD TaCN electrodes
Maes, Jan; Swerts, Johan; Pierreux, Dieter; Machkaoutsan, Vladimir; Marcus, Steven; Milligan, Brennan; Schram, Tom; Ragnarsson, Lars-Ake; Cacciato, Antonio; Rohr, Erika; Rothschild, Aude; Hendrickx, Paul; Breuil, Laurent; Van den Bosch, Geert (2009) -
Barrier reliability for Cu contacts
Zhao, Chao; Demuynck, Steven; Van den Bosch, Geert; Tokei, Zsolt; Beyer, Gerald (2007) -
Breakdown and hot carrier injection in deep trench isolation structures
Elattari, Brahim; Coppens, P.; Van den Bosch, Geert; Moens, P.; Groeseneken, Guido (2005) -
Carrier profiling of a cross-sectioned silicon nanowire by scanning spreading resistance microscopy
Hantschel, Thomas; Schulz, Volker; Zschaetzsch, Gerd; Eyben, Pierre; Verhulst, Anne; Schmidt, Volker; Vereecken, Philippe; Van den Bosch, Geert; Vandervorst, Wilfried (2007) -
Channel and gate stack charge trapping investigation in vertical 3D NAND devices with poly-silicon channel
Subirats, Alexandre; Arreghini, Antonio; Breuil, Laurent; Degraeve, Robin; Van den Bosch, Geert; Linten, Dimitri; Furnemont, Arnaud (2017) -
Channel and near channel defects characterization in vertical InxGa1-xAs high mobility channels for future 3D NAND memory
Subirats, Alexandre; Capogreco, Elena; Degraeve, Robin; Arreghini, Antonio; Van den Bosch, Geert; Linten, Dimitri; Van Houdt, Jan; Furnemont, Arnaud (2016) -
Characterization of dynamic SOA of power MOSFETs limited by electrothermal breakdown
Van den Bosch, Geert; Wojciechowski, Dominique; Elattari, Brahim; Moens, Peter; Groeseneken, Guido (2005-09) -
Characterizing grain size and defect energy distribution in vertical SONOS poly-Si channels by means of a resistive network model
Degraeve, Robin; Toledano Luque, Maria; Arreghini, Antonio; Tang, Baojun; Capogreco, Elena; Lisoni, Judit; Roussel, Philippe; Kaczer, Ben; Van den Bosch, Geert; Groeseneken, Guido; Van Houdt, Jan (2013) -
Charge trapping effects and interface state generation in a 40V lateral resurf pDMOS transistor
Moens, Peter; Van den Bosch, Geert; Wojciechowski, Dominique; Bauwens, Filip; De Vleeschouwer, Herbert; De Pestel, Freddy (2005-09) -
Competing hot carrier degradation mechanisms in lateral n-type DMOS transistors
Moens, P.; Van den Bosch, Geert; Groeseneken, Guido (2003) -
Comprehensive investigation of the impact of lateral charge migration on retention performance of planar and 3D SONOS devices
Maconi, Alessandro; Arreghini, Antonio; Monzio Compagnoni, Christian; Van den Bosch, Geert; Spinelli, Alessandro S.; Van Houdt, Jan; Lacaita, Andrea L. (2012) -
Comprehensive study of postprocessed copper heat sinks on smart power drivers for thermal SOA improvement
Van den Bosch, Geert; Driessens, Evelien; Webers, Tomas; Elattari, Brahim; Wojchiechowski, Dominique; Gassot, Pierre; Moens, Peter; Groeseneken, Guido (2005-04)