Authors

Bastos, Joao; Arreghini, Antonio; Verreck, Devin; Schanovsky, Franz; Degraeve, Robin; Linten, Dimitri; Van den Bosch, Geert; Furnemont, Arnaud

Conference

International Integrated Reliability Workshop - IIRW

Title

Application of single pulse dynamics to model program anderase cycling-induced defects in the tunnel oxide of charge-trapping devices

Publication type

Proceedings paper