Publication:

Application of single pulse dynamics to model program anderase cycling-induced defects in the tunnel oxide of charge-trapping devices

Date

2019
Proceedings Paper
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dc.contributor.authorBastos, Joao
dc.contributor.authorArreghini, Antonio
dc.contributor.authorVerreck, Devin
dc.contributor.authorSchanovsky, Franz
dc.contributor.authorDegraeve, Robin
dc.contributor.authorLinten, Dimitri
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorFurnemont, Arnaud
dc.contributor.imecauthorBastos, Joao
dc.contributor.imecauthorArreghini, Antonio
dc.contributor.imecauthorVerreck, Devin
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorFurnemont, Arnaud
dc.contributor.orcidimecBastos, Joao::0000-0002-8877-9850
dc.contributor.orcidimecArreghini, Antonio::0000-0002-7493-9681
dc.contributor.orcidimecVerreck, Devin::0000-0002-3833-5880
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecFurnemont, Arnaud::0000-0002-6378-1030
dc.date.accessioned2021-10-27T07:30:12Z
dc.date.available2021-10-27T07:30:12Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32498
dc.source.conferenceInternational Integrated Reliability Workshop - IIRW
dc.source.conferencedate13/10/2019
dc.source.conferencelocationFallen Leaf Lake USA
dc.title

Application of single pulse dynamics to model program anderase cycling-induced defects in the tunnel oxide of charge-trapping devices

dc.typeProceedings paper
dspace.entity.typePublication
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