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Application of single pulse dynamics to model program anderase cycling-induced defects in the tunnel oxide of charge-trapping devices
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Application of single pulse dynamics to model program anderase cycling-induced defects in the tunnel oxide of charge-trapping devices
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Date
2019
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bastos, Joao
;
Arreghini, Antonio
;
Verreck, Devin
;
Schanovsky, Franz
;
Degraeve, Robin
;
Linten, Dimitri
;
Van den Bosch, Geert
;
Furnemont, Arnaud
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1954
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Acq. date: 2025-12-10
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Views
1954
since deposited on 2021-10-27
1
last month
1
last week
Acq. date: 2025-12-10
Citations