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Comprehensive investigation of the impact of lateral charge migration on retention performance of planar and 3D SONOS devices
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Authors
Maconi, Alessandro
;
Arreghini, Antonio
;
Monzio Compagnoni, Christian
;
Van den Bosch, Geert
;
Spinelli, Alessandro S.
;
Van Houdt, Jan
;
Lacaita, Andrea L.
ISSN
0038-1101
Journal
Solid-State Electronics
Volume
74
Title
Comprehensive investigation of the impact of lateral charge migration on retention performance of planar and 3D SONOS devices
Publication type
Journal article
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