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Comprehensive investigation of the impact of lateral charge migration on retention performance of planar and 3D SONOS devices
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Comprehensive investigation of the impact of lateral charge migration on retention performance of planar and 3D SONOS devices
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Date
2012
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Maconi, Alessandro
;
Arreghini, Antonio
;
Monzio Compagnoni, Christian
;
Van den Bosch, Geert
;
Spinelli, Alessandro S.
;
Van Houdt, Jan
;
Lacaita, Andrea L.
Journal
Solid-State Electronics
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1965
since deposited on 2021-10-20
2
last month
Acq. date: 2026-01-07
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Metrics
Views
1965
since deposited on 2021-10-20
2
last month
Acq. date: 2026-01-07
Citations