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Comprehensive investigation of the impact of lateral charge migration on retention performance of planar and 3D SONOS devices

Date

2012
Journal article
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dc.contributor.authorMaconi, Alessandro
dc.contributor.authorArreghini, Antonio
dc.contributor.authorMonzio Compagnoni, Christian
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorSpinelli, Alessandro S.
dc.contributor.authorVan Houdt, Jan
dc.contributor.authorLacaita, Andrea L.
dc.contributor.imecauthorArreghini, Antonio
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecArreghini, Antonio::0000-0002-7493-9681
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.accessioned2021-10-20T13:03:10Z
dc.date.available2021-10-20T13:03:10Z
dc.date.issued2012
dc.identifier.issn0038-1101
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21072
dc.source.beginpage64
dc.source.endpage70
dc.source.journalSolid-State Electronics
dc.source.volume74
dc.title

Comprehensive investigation of the impact of lateral charge migration on retention performance of planar and 3D SONOS devices

dc.typeJournal article
dspace.entity.typePublication
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