Assessment of oxide reliability and hot carrier degradation in CMOS technology

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Authors
Maes, Herman; Groeseneken, Guido; Degraeve, Robin; De Blauwe, Jan; Van den Bosch, Geert
Journal
Microelectronic Engineering
Volume
40
Title
Assessment of oxide reliability and hot carrier degradation in CMOS technology
Publication type
Journal article
Embargo date
9999-12-31
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