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Charge trapping effects and interface state generation in a 40V lateral resurf pDMOS transistor
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Authors
Moens, Peter
;
Van den Bosch, Geert
;
Wojciechowski, Dominique
;
Bauwens, Filip
;
De Vleeschouwer, Herbert
;
De Pestel, Freddy
Conference
Proceedings of the 35th European Solid-State Device Research Conference - ESSDERC
Title
Charge trapping effects and interface state generation in a 40V lateral resurf pDMOS transistor
Publication type
Proceedings paper
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