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Charge trapping effects and interface state generation in a 40V lateral resurf pDMOS transistor
Publication:
Charge trapping effects and interface state generation in a 40V lateral resurf pDMOS transistor
Date
2005-09
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Moens, Peter
;
Van den Bosch, Geert
;
Wojciechowski, Dominique
;
Bauwens, Filip
;
De Vleeschouwer, Herbert
;
De Pestel, Freddy
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1888
since deposited on 2021-10-16
1
last month
Acq. date: 2025-12-08
Citations
Metrics
Views
1888
since deposited on 2021-10-16
1
last month
Acq. date: 2025-12-08
Citations