Publication:
Charge trapping effects and interface state generation in a 40V lateral resurf pDMOS transistor
Date
| dc.contributor.author | Moens, Peter | |
| dc.contributor.author | Van den Bosch, Geert | |
| dc.contributor.author | Wojciechowski, Dominique | |
| dc.contributor.author | Bauwens, Filip | |
| dc.contributor.author | De Vleeschouwer, Herbert | |
| dc.contributor.author | De Pestel, Freddy | |
| dc.contributor.imecauthor | Moens, Peter | |
| dc.contributor.imecauthor | Van den Bosch, Geert | |
| dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
| dc.date.accessioned | 2021-10-16T03:29:23Z | |
| dc.date.available | 2021-10-16T03:29:23Z | |
| dc.date.issued | 2005-09 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10897 | |
| dc.source.beginpage | 407 | |
| dc.source.conference | Proceedings of the 35th European Solid-State Device Research Conference - ESSDERC | |
| dc.source.conferencedate | 12/09/2005 | |
| dc.source.conferencelocation | Grenoble France | |
| dc.source.endpage | 410 | |
| dc.title | Charge trapping effects and interface state generation in a 40V lateral resurf pDMOS transistor | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |