Browsing by author "Van den Bosch, Geert"
Now showing items 41-60 of 202
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Comprehensive understanding of charge lateral migration in 3D SONOS memories
Liu, Lifang; Arreghini, Antonio; Van den Bosch, Geert; Pan, Liyang; Van Houdt, Jan (2016) -
Correlation between hot carrier stress, oxide breakdown and gate leakage current for monitoring plasma processing induced damage on gate oxide
Zhichun, Wang; Ackaert, J.; Salm, C.; de Backer, E.; Van den Bosch, Geert; Zawalski, Wade (2002) -
Critical analysis of the substrate hot-hole injection technique
Van den Bosch, Geert; Groeseneken, Guido; Maes, Herman (1994) -
Cu contact technology for sub-100nm contacts
Demuynck, Steven; Zhao, Chao; Hinomura, Toru; Tokei, Zsolt; Van den Bosch, Geert; Beyer, Gerald (2007) -
Defect profiling in FEFET Si:HfO2 layers
O'Sullivan, Barry; Putcha, Vamsi; Izmailov, Roman; Afanas'ev, Valeri V.; Simoen, Eddy; Jung, Taehwan; Higashi, Yusuke; Degraeve, Robin; Truijen, Brecht; Kaczer, Ben; Ronchi, Nicolo; McMitchell, Sean; Banerjee, Kaustuv; Clima, Sergiu; Breuil, Laurent; Van den Bosch, Geert; Linten, Dimitri; Van Houdt, Jan (2020) -
Defects characterization of hybrid floating gate/ inter-gate dielectric interface in flash memory
Zahid, Mohammed; Degraeve, Robin; Tang, Baojun; Lisoni, Judit; Van den Bosch, Geert; Van Houdt, Jan; Breuil, Laurent; Blomme, Pieter; Arreghini, Antonio (2014) -
Demonstration of 64 Conductance States and Large Dynamic Range in Sidoped HfO2 FeFETs under Neuromorphic Computing Operations
Wang, Yu-Yun; Wang, Kuang-Chi; Wu, Cheng-Hung; Chang, Ting-Yu; Ronchi, Nicolo; Banerjee, Kaustuv; Van den Bosch, Geert; Van Houdt, Jan; Wu, Tian-Li (2022-04-18) -
Demonstration of asymmetric gate-oxide thickness four-terminal FinFETs having flexible threshold voltage and good subthreshold slope
Masahara, Meishoku; Surdeanu, Radu; Witters, Liesbeth; Doornbos, Gerben; Nguyen Hoang, Viet; Van den Bosch, Geert; Vrancken, Christa; Devriendt, Katia; Neuilly, Francois; Kunnen, Eddy; Jurczak, Gosia; Biesemans, Serge (2007-03) -
Design and characterization of a post-processed copper heat sink for smart power drivers
Van den Bosch, Geert; Webers, Tomas; Driessens, Evelien; Elattari, Brahim; Wojciechowski, Dominique; Gassot, Pierre; Moens, Peter; Groeseneken, Guido (2005-04) -
Detailed study of the parasitic geometric current components in charge pumping measurements: determination of relevant parameters
Habas, Predrag; Groeseneken, Guido; Van den Bosch, Geert; Maes, Herman; Gornik, E. (1997) -
Device and materials options for charge trap NAND Flash memory
Van den Bosch, Geert; Van Houdt, Jan (2009) -
Direct three-dimensional observation of the conduction in poly-Si and In1-xGaxAs 3D NAND vertical channels
Celano, Umberto; Capogreco, Elena; Lisoni, Judit; Arreghini, Antonio; Kunert, Bernardette; Guo, Weiming; Van den Bosch, Geert; Van Houdt, Jan; De Meyer, Kristin; Furnemont, Arnaud; Vandervorst, Wilfried (2016) -
Effect of high temperature annealing on tunnel oxide properties in TANOS devices
Arreghini, Antonio; Zahid, Mohammed; Van den Bosch, Geert; Suhane, Amit; Breuil, Laurent; Cacciato, Antonio; Van Houdt, Jan (2011) -
Effect of top dielectric morphology and gate material on the performance of nitride-based FLASH memory cells
Cacciato, Antonio; Breuil, Laurent; Van den Bosch, Geert; Richard, Olivier; Rothschild, Aude; Furnemont, Arnaud; Bender, Hugo; Kittl, Jorge; Van Houdt, Jan (2008) -
Effects of Geometry and Cycling on the Radiation Response of Charge-Trapping NAND Memory Devices With SiON Tunneling Oxide
Cao, Jingchen; Wynocker, Isabella; Zhang, En Xia; Reed, Robert A.; Alles, Michael L.; Schrimpf, Ronald D.; Fleetwood, Daniel M.; Arreghini, Antonio; Rosmeulen, Maarten; Bastos, Joao; Van den Bosch, Geert; Linten, Dimitri (2023-04-18) -
Electrical and physical characterization of Polycrystalline III-V compounds
Capogreco, Elena; Lisoni, Judit; Merckling, Clement; Numata, Toshinori; Arreghini, Antonio; De Meyer, Kristin; Van den Bosch, Geert; Van Houdt, Jan (2014) -
Electrical assessment of gate oxide punchthrough in advanced polysilicon high density plasma etch.
Van den Bosch, Geert; Beckx, Stephan; Dupas, Luc; Vanhaelemeersch, Serge; Deferm, Ludo (1999) -
Electrical defects in dielectrics for flash memories studied by Trap Spectroscopy by Charge Injection and Sensing (TSCIC)
Degraeve, Robin; Cho, Moon Ju; Govoreanu, Bogdan; Kaczer, Ben; Zahid, Mohammed; Van den Bosch, Geert; Van Houdt, Jan; Jurczak, Gosia; Groeseneken, Guido (2009) -
Electrical Investigation of Wake-Up in High Endurance Fatigue-Free La and Y Doped HZO Meal-Ferroelectric-Metal Capacitors
Walke, Amey; Popovici, Mihaela Ioana; Banerjee, Kaustuv; Clima, Sergiu; Kumbhare, Pankaj; Desmet, Johan; Meersschaut, Johan; Van den Bosch, Geert; Delhougne, Romain; Kar, Gouri Sankar; Van Houdt, Jan (2022-07-12) -
Electrolithic Memory: A New Device for Ultrahigh-Density Data Storage
Fransen, Senne; Willems, Kherim; Philipsen, Harold; Verreck, Devin; Van Roy, Wim; Henry, Olivier; Arreghini, Antonio; Van den Bosch, Geert; Furnemont, Arnaud; Rosmeulen, Maarten (2022)