Comprehensive understanding of charge lateral migration in 3D SONOS memories

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Authors

Liu, Lifang; Arreghini, Antonio; Van den Bosch, Geert; Pan, Liyang; Van Houdt, Jan

ISSN

0038-1101

Journal

Solid-State Electronics

Volume

116

Title

Comprehensive understanding of charge lateral migration in 3D SONOS memories

Publication type

Journal article

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