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Comprehensive understanding of charge lateral migration in 3D SONOS memories
Publication:
Comprehensive understanding of charge lateral migration in 3D SONOS memories
Date
2016
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Liu, Lifang
;
Arreghini, Antonio
;
Van den Bosch, Geert
;
Pan, Liyang
;
Van Houdt, Jan
Journal
Solid-State Electronics
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1927
since deposited on 2021-10-23
Acq. date: 2025-10-23
Citations
Metrics
Views
1927
since deposited on 2021-10-23
Acq. date: 2025-10-23
Citations