Publication:
Comprehensive understanding of charge lateral migration in 3D SONOS memories
Date
| dc.contributor.author | Liu, Lifang | |
| dc.contributor.author | Arreghini, Antonio | |
| dc.contributor.author | Van den Bosch, Geert | |
| dc.contributor.author | Pan, Liyang | |
| dc.contributor.author | Van Houdt, Jan | |
| dc.contributor.imecauthor | Arreghini, Antonio | |
| dc.contributor.imecauthor | Van den Bosch, Geert | |
| dc.contributor.imecauthor | Van Houdt, Jan | |
| dc.contributor.orcidimec | Arreghini, Antonio::0000-0002-7493-9681 | |
| dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
| dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
| dc.date.accessioned | 2021-10-23T12:16:55Z | |
| dc.date.available | 2021-10-23T12:16:55Z | |
| dc.date.issued | 2016 | |
| dc.identifier.issn | 0038-1101 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/26919 | |
| dc.identifier.url | http://www.sciencedirect.com/science/article/pii/S003811011500355X | |
| dc.source.beginpage | 95 | |
| dc.source.endpage | 99 | |
| dc.source.journal | Solid-State Electronics | |
| dc.source.volume | 116 | |
| dc.title | Comprehensive understanding of charge lateral migration in 3D SONOS memories | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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