Authors

Degraeve, Robin; Cho, Moon Ju; Govoreanu, Bogdan; Kaczer, Ben; Zahid, Mohammed; Van den Bosch, Geert; Van Houdt, Jan; Jurczak, Gosia; Groeseneken, Guido

Conference

International Conference on Solid State Materials and Devices - SSDM

Title

Electrical defects in dielectrics for flash memories studied by Trap Spectroscopy by Charge Injection and Sensing (TSCIC)

Publication type

Proceedings paper

Embargo date

9999-12-31