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Electrical defects in dielectrics for flash memories studied by Trap Spectroscopy by Charge Injection and Sensing (TSCIC)
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1885 since deposited on 2021-10-17
1last month
Acq. date: 2026-04-27
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Statistics
Views
1885 since deposited on 2021-10-17
1last month
Acq. date: 2026-04-27
Citations