Authors

Cacciato, Antonio; Breuil, Laurent; Van den Bosch, Geert; Richard, Olivier; Rothschild, Aude; Furnemont, Arnaud; Bender, Hugo; Kittl, Jorge; Van Houdt, Jan

Conference

Materials Science and Technology for Nonvolatile Memories

Title

Effect of top dielectric morphology and gate material on the performance of nitride-based FLASH memory cells

Publication type

Proceedings paper