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Conference contributions
Electrical assessment of gate oxide punchthrough in advanced polysilicon high density plasma etch.
Publication:
Electrical assessment of gate oxide punchthrough in advanced polysilicon high density plasma etch.
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Date
1999
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van den Bosch, Geert
;
Beckx, Stephan
;
Dupas, Luc
;
Vanhaelemeersch, Serge
;
Deferm, Ludo
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1912
since deposited on 2021-10-14
Acq. date: 2026-01-07
Citations
Metrics
Views
1912
since deposited on 2021-10-14
Acq. date: 2026-01-07
Citations