Browsing by author "McMitchell, Sean"
Now showing items 1-20 of 23
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A comprehensive variability study of doped HfO2 FeFET for memory applications
Ronchi, Nicolo; Ragnarsson, Lars-Ake; Celano, Umberto; Kaczer, Ben; Kaczmarek, Jakub; Banerjee, Kaustuv; McMitchell, Sean; Van den Bosch, Geert; Van Houdt, Jan (2022) -
Advanced characterization methods for HfO2/ZrO2-based ferroelectrics
Lomenzo, Patrick D. D.; Celano, Umberto; Kaempfe, Thomas; McMitchell, Sean (2023) -
Defect profiling in FEFET Si:HfO2 layers
O'Sullivan, Barry; Putcha, Vamsi; Izmailov, Roman; Afanas'ev, Valeri V.; Simoen, Eddy; Jung, Taehwan; Higashi, Yusuke; Degraeve, Robin; Truijen, Brecht; Kaczer, Ben; Ronchi, Nicolo; McMitchell, Sean; Banerjee, Kaustuv; Clima, Sergiu; Breuil, Laurent; Van den Bosch, Geert; Linten, Dimitri; Van Houdt, Jan (2020) -
Dielectric Response in Ferroelectrics Near Polarization Switching: Analytical Calculations, First-Principles Modeling, and Experimental Verification
Clima, Sergiu; Verhulst, Anne; Bagul, Pratik; Truijen, Brecht; McMitchell, Sean; De Wolf, Ingrid; Pourtois, Geoffrey; Van Houdt, Jan (2022) -
Elucidating possible crystallographic origins of wake-up mechanisms in ferroelectric hafnia
McMitchell, Sean; Clima, Sergiu; Ronchi, Nicolo; Banerjee, Kaustuv; Celano, Umberto; Popovici, Mihaela Ioana; Di Piazza, Luca; Van den Bosch, Geert; Van Houdt, Jan (2021) -
Endurance of ferroelectric La-doped HfO2 for SFS gate-stack memory devices
Ronchi, Nicolo; McMitchell, Sean; Min, Jinhong; Banerjee, Kaustuv; Van den Bosch, Geert; Shin, Changhwan; Van Houdt, Jan (2020) -
Engineering Strain and Texture in Ferroelectric Scandium-Doped Aluminium Nitride
McMitchell, Sean; Walke, Amey; Banerjee, Kaustuv; Mertens, Sofie; Piao, Xiaoyu; Mao, Ming; Katcko, Kostantine; Vellianitis, Georgios; Van Dal, Mark; Lin, Yu-Ming; Van den Bosch, Geert; Delhougne, Romain; Kar, Gouri Sankar (2023) -
Ferroelectric FET with Gd-doped HfO2: A Step Towards Better Uniformity and Improved Memory Performance
Ronchi, Nicolo; Ragnarsson, Lars-Ake; Breuil, Laurent; Banerjee, Kaustuv; McMitchell, Sean; O'Sullivan, Barry; Milenin, Alexey; Kundu, Shreya; Pak, Murat; Van den Bosch, Geert; Van Houdt, Jan (2021) -
Ferroelectric La-Doped ZrO2/HfxZr1-xO2 Bilayer Stacks with Enhanced Endurance
Popovici, Mihaela Ioana; Walke, Amey; Banerjee, Kaustuv; Ronchi, Nicolo; Meersschaut, Johan; Celano, Umberto; McMitchell, Sean; Spampinato, Valentina; Franquet, Alexis; Favia, Paola; Swerts, Johan; Van den Bosch, Geert; Van Houdt, Jan (2021) -
Ferroelectricity in Si-doped hafnia: probing challenges in absence of screening charges
Celano, Umberto; Gomez, Andres; Piedimonte, Paola; Neumayer, Sabine; Collins, Liam; Popovici, Mihaela Ioana; Florent, Karine; McMitchell, Sean; Favia, Paola; Drijbooms, Chris; Bender, Hugo; Paredis, Kristof; Di Piazza, Luca; Jesse, Stephen; Van Houdt, Jan; van der Heide, Paul (2020) -
First demonstration of ferroelectric Si:Hf0(2) based 3D FE-FET with trench architecture for dense non-volatile memory application
Banerjee, Kaustuv; Breuil, Laurent; Milenin, Alexey; Pak, Murat; Stiers, Jimmy; McMitchell, Sean; Di Piazza, Luca; Van den Bosch, Geert; Van Houdt, Jan (2021) -
First-principles perspective on poling mechanisms and ferroelectric/ antiferroelectric behavior of Hf1-xZrxO2 for FEFET applications
Clima, Sergiu; McMitchell, Sean; Florent, Karine; Nyns, Laura; Popovici, Mihaela Ioana; Ronchi, Nicolo; Di Piazza, Luca; Van Houdt, Jan; Pourtois, Geoffrey (2018) -
Impact of Charge Trapping and Depolarization on Data Retention Using Simultaneous P-V and I-V in HfO2-Based Ferroelectric FET
Higashi, Yusuke; Ronchi, Nicolo; Kaczer, Ben; Alam, Md Nur Kutubul; O'Sullivan, Barry; Banerjee, Kaustuv; McMitchell, Sean; Breuil, Laurent; Walke, Amey; Van den Bosch, Geert; Linten, Dimitri; Van Houdt, Jan (2021) -
Impact of charge trapping on imprint and its recovery in HfO2 based FeFET
Higashi, Yusuke; Ronchi, Nicolo; Kaczer, Ben; Banerjee, Kaustuv; McMitchell, Sean; O'Sullivan, Barry; Clima, Sergiu; Minj, Albert; Celano, Umberto; Di Piazza, Luca; Suzuki, Masamichi; Linten, Dimitri; Van Houdt, Jan (2019) -
Impact of mechanical strain on wakeup of HfO2 ferroelectric memory
Kruv, Anastasiia; McMitchell, Sean; Clima, Sergiu; Okudur, Oguzhan Orkut; Ronchi, Nicolo; Van den Bosch, Geert; Gonzalez, Mario; De Wolf, Ingrid; Van Houdt, Jan (2021) -
Impacts of Pulsing Schemes on the Endurance of Ferroelectric Metal-Ferroelectric-Insulator-Semiconductor Capacitors
Wu, Cheng-Hung; Ronchi, Nicolo; Wang, Kuan-Chi; Wang, Yu-Yun; Mcmitchell, Sean; Banerjee, Kaustuv; van den Bosch, Geert; van Houdt, Jan; Wu, Tian-Li (2022) -
Investigation of imprint in FE-HfO2 and its recovery
Higashi, Yusuke; Kaczer, Ben; Verhulst, Anne; O'Sullivan, Barry; Ronchi, Nicolo; McMitchell, Sean; Banerjee, Kaustuv; Di Piazza, Luca; Suzuki, Masamichi; Linten, Dimitri; Van Houdt, Jan (2020) -
Microwave Properties of Ba-Substituted Pb(Zr0.52Ti0.48)O3 after Chemical Mechanical Polishing
Luciano, Federica; Teugels, Lieve; McMitchell, Sean; Talmelli, Giacomo; Guerenneur, Anais; Stheins, Renzo; Caluwaerts, Rudy; Conard, Thierry; Vaesen, Inge; Sergeant, Stefanie; Van Dorpe, Pol; De Gendt, Stefan; Dekkers, Matthijn; Swerts, Johan; Ciubotaru, Florin; Adelmann, Christoph (2023) -
New insights into the imprint effect in FE-HfO and its recovery
Higashi, Yusuke; Florent, Karine; Subirats, Alexandre; Kaczer, Ben; Di Piazza, Luca; Clima, Sergiu; Ronchi, Nicolo; McMitchell, Sean; Banerjee, Kaustuv; Celano, Umberto; Suzuki, Masamichi; Linten, Dimitri; Van Houdt, Jan (2019) -
Probing the evolution of electrically active defects in doped ferroelectric HfO2 during wake-up and fatigue
Celano, Umberto; Chen, Yi-Hsuan; Minj, Albert; Banerjee, Kaustuv; Ronchi, Nicolo; McMitchell, Sean; Van Marcke, Patricia; Favia, Paola; Wu, T. L.; Kaczer, Ben; Van den Bosch, Geert; Van Houdt, Jan; van der Heide, Paul (2020)