Publication:
Impact of Charge Trapping and Depolarization on Data Retention Using Simultaneous P-V and I-V in HfO2-Based Ferroelectric FET
Loading...
Journal
Abstract
Description
Metrics
Views
1903 since deposited on 2022-02-24
Acq. date: 2026-01-09
Citations
Metrics
Views
1903 since deposited on 2022-02-24
Acq. date: 2026-01-09
Citations