Publication:
Impact of Charge Trapping and Depolarization on Data Retention Using Simultaneous P-V and I-V in HfO2-Based Ferroelectric FET
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1900 since deposited on 2022-02-24
1last week
Acq. date: 2025-10-28
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Views
1900 since deposited on 2022-02-24
1last week
Acq. date: 2025-10-28
Citations