Impact of Charge Trapping and Depolarization on Data Retention Using Simultaneous P-V and I-V in HfO2-Based Ferroelectric FET

Higashi, Yusuke; Ronchi, Nicolo; Kaczer, Ben; Alam, Md Nur Kutubul; O'Sullivan, Barry; Banerjee, Kaustuv; McMitchell, Sean; Breuil, Laurent; Walke, Amey; Van den Bosch, Geert; Linten, Dimitri; Van Houdt, Jan

doi:10.1109/TED.2021.3096510

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Impact of Charge Trapping and Depolarization on Data Retention Using Simultaneous P-V and I-V in HfO2-Based Ferroelectric FET

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2021

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https://doi.org/10.1109/TED.2021.3096510

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IEEE TRANSACTIONS ON ELECTRON DEVICES

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Acq. date: 2026-04-06

Impact of Charge Trapping and Depolarization on Data Retention Using Simultaneous P-V and I-V in HfO2-Based Ferroelectric FET

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