Investigation of imprint in FE-HfO2 and its recovery

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Authors

Higashi, Yusuke; Kaczer, Ben; Verhulst, Anne; O'Sullivan, Barry; Ronchi, Nicolo; McMitchell, Sean; Banerjee, Kaustuv; Di Piazza, Luca; Suzuki, Masamichi; Linten, Dimitri; Van Houdt, Jan

ISSN

0018-9383

Issue

11

Journal

IEEE Transactions on Electron Devices

Volume

67

Title

Investigation of imprint in FE-HfO2 and its recovery

Publication type

Journal article

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