Publication:

Investigation of imprint in FE-HfO2 and its recovery

Date

2020
Journal article
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Author(s)

Higashi, Yusuke  
;
Kaczer, Ben  
;
Verhulst, Anne  
;
O'Sullivan, Barry  
;
Ronchi, Nicolo  
;
McMitchell, Sean  
;
Banerjee, Kaustuv  
;
Di Piazza, Luca  
;
Suzuki, Masamichi  
;
Linten, Dimitri  
;
Van Houdt, Jan  

Journal

IEEE Transactions on Electron Devices

Abstract

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1996 since deposited on 2021-10-28
Acq. date: 2026-04-26

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1996 since deposited on 2021-10-28
Acq. date: 2026-04-26

Citations