Publication:

Investigation of imprint in FE-HfO2 and its recovery

Date

2020
Journal article
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Author(s)

Higashi, Yusuke  
;
Kaczer, Ben  
;
Verhulst, Anne  
;
O'Sullivan, Barry  
;
Ronchi, Nicolo  
;
McMitchell, Sean  
;
Banerjee, Kaustuv  
;
Di Piazza, Luca  
;
Suzuki, Masamichi  
;
Linten, Dimitri  
;
Van Houdt, Jan  

Journal

IEEE Transactions on Electron Devices

Abstract

Description

Statistics

Views

1996 since deposited on 2021-10-28
Acq. date: 2026-03-17

Citations

Statistics

Views

1996 since deposited on 2021-10-28
Acq. date: 2026-03-17

Citations