Browsing by author "Van Houdt, Jan"
Now showing items 1-20 of 366
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3D memories and ferroelectrics
Van Houdt, Jan (2017) -
A 180nm secondary electron injection flash device
Xue, Gang; Van Houdt, Jan; Haspeslagh, Luc; Wellekens, Dirk; Keppens, Bart; Maes, Herman (2001) -
A 1Mbit HIMOS® flash memory embedded in a 0.35μm CMOS process
Van Houdt, Jan; Tsouhlarakis, Jorgo; Hendrickx, Paul; Vanhorebeek, Guido; Wellekens, Dirk; Haspeslagh, Luc; Deferm, Ludo; Maes, Herman (2000) -
A 25ns/byte-programmable low-power SSI flash array with a new low-voltage erase scheme for embedded memory applications
Van Houdt, Jan; Haspeslagh, Luc; Wellekens, Dirk; Vanhorebeek, Guido; Groeseneken, Guido; Deferm, Ludo; Maes, Herman (1995) -
A 5 V-Compatible Flash EEPROM Cell with Microsecond Programming Time for Embedded Memory Applications
Van Houdt, Jan; Wellekens, Dirk; Faraone, Lorenzo; Haspeslagh, Luc; Deferm, Ludo; Groeseneken, Guido; Maes, Herman (1994) -
A CMOS DC voltage doubler with nonoverlapping switching control
Kim, Shi-Ho; Tsouhlarakis, Jorgo; Van Houdt, Jan; Maes, Herman (2001) -
A comprehensive understanding of the erase of TANOS memories through charge separation experiments and simulations
Padovani, Andrea; Arreghini, Antonio; Vandelli, Luca; Larcher, Luca; Van den Bosch, Geert; Pavan, Paolo; Van Houdt, Jan (2011) -
A comprehensive variability study of doped HfO2 FeFET for memory applications
Ronchi, Nicolo; Ragnarsson, Lars-Ake; Celano, Umberto; Kaczer, Ben; Kaczmarek, Jakub; Banerjee, Kaustuv; McMitchell, Sean; Van den Bosch, Geert; Van Houdt, Jan (2022) -
A consistent model for oxide trap profiling with the trap spectroscopy by charge injection and sensing (TSCIS) technique
Cho, Moon Ju; Degraeve, Robin; Roussel, Philippe; Govoreanu, Bogdan; Kaczer, Ben; Zahid, Mohammed; Simoen, Eddy; Arreghini, Antonio; Jurczak, Gosia; Van Houdt, Jan; Groeseneken, Guido (2010) -
A consistent model for the SANOS programming operation
Furnemont, Arnaud; Rosmeulen, Maarten; Cacciato, Antonio; Breuil, Laurent; De Meyer, Kristin; Maes, Herman; Van Houdt, Jan (2007) -
A discharge-based multi-pulse technique (DMP) for probing electron trap energy distribution in high-k materials for Flash memory applications
Zheng, X. F.; Zhang, W. .D; Govoreanu, Bogdan; Zhang, J. F.; Van Houdt, Jan (2009) -
A FeFET with a novel MFMFIS gate stack: towards energy-efficient and ultrafast NVMs for neuromorphic computing
Ali, Tarek; Mertens, Konstantin; Kuehnel, Kati; Rudolph, Matthias; Oehler, Sebastian; Lehninger, David; Mueller, Franz; Revello, Ricardo; Hoffmann, Raik; Zimmermann, Katrin; Kaempfe, Thomas; Czernohorsky, Malte; Seidel, Konrad; Van Houdt, Jan; Eng, Lukas M. (2021) -
A figure of merit for flash memory multi-leyer tunnel dielectrics
Govoreanu, Bogdan; Blomme, Pieter; Rosmeulen, Maarten; Van Houdt, Jan; De Meyer, Kristin (2001) -
A flash memory technology with quasi-virtual ground array for low-cost embedded applications
Tsouhlarakis, Jorgo; Vanhorebeek, Guido; Verhoeven, Geert; De Blauwe, Jan; Kim, Shi-Ho; Wellekens, Dirk; Hendrickx, Paul; Haspeslagh, Luc; Van Houdt, Jan; Maes, Herman (2001) -
A fully planar stacked gate flash technology with T-shaped floating gate for increased cell coupling ratio
De Vos, Joeri; Haspeslagh, Luc; Blomme, Pieter; Demand, Marc; Devriendt, Katia; Vleugels, Frank; Wellekens, Dirk; Van Houdt, Jan (2007) -
A low voltage, high performance 0.35 μm embedded flash EEPROM cell technology
Wellekens, Dirk; Van Houdt, Jan; De Blauwe, Jan; Haspeslagh, Luc; Deferm, Ludo; Maes, Herman (1998) -
A low-cost poly-sidewall erase HIMOSTM technology for 130-90nm embedded flash memories
Van Houdt, Jan; Haspeslagh, Luc; Wellekens, Dirk; De Vos, Joeri; Hendrickx, Paul; Tsouhlarakis, Jorgo (2004) -
A model for tunneling current in multi-layer tunnel dielectrics
Govoreanu, Bogdan; Blomme, Pieter; Rosmeulen, Maarten; Van Houdt, Jan; De Meyer, Kristin (2003) -
A new 2 isolated-bits/cell Flash memory device with self aligned split gate structure using ONO stacks for charge storage
Breuil, Laurent; Schuler, Franz; Haspeslagh, Luc; Wellekens, Dirk; De Vos, Joeri; Lorenzini, Martino; Van Houdt, Jan (2003) -
A new quantitative model to predict SILC-related disturb characteristics in Flash E2PROM devices
De Blauwe, Jan; Van Houdt, Jan; Wellekens, Dirk; Degraeve, Robin; Roussel, Philippe; Haspeslagh, Luc; Deferm, Ludo; Groeseneken, Guido; Maes, Herman (1996)