Authors

Cho, Moon Ju; Degraeve, Robin; Roussel, Philippe; Govoreanu, Bogdan; Kaczer, Ben; Zahid, Mohammed; Simoen, Eddy; Arreghini, Antonio; Jurczak, Gosia; Van Houdt, Jan; Groeseneken, Guido

ISSN

0038-1101

Issue

11

Journal

Solid-State Electronics

Volume

54

Title

A consistent model for oxide trap profiling with the trap spectroscopy by charge injection and sensing (TSCIS) technique

Publication type

Journal article