Publication:
A consistent model for oxide trap profiling with the trap spectroscopy by charge injection and sensing (TSCIS) technique
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2049 since deposited on 2021-10-18
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Acq. date: 2026-03-18
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Statistics
Views
2049 since deposited on 2021-10-18
1last month
1last week
Acq. date: 2026-03-18
Citations