Browsing by author "Garros, X."
Now showing items 1-2 of 2
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A new method for quickly evaluating reversible and permanent components of the BTI degradation
Garros, X.; Subirats, Alexandre; Reimbold, G.; Gaillard, F.; Diouf, C.; Federspiel, X.; Huard, V.; Rafik, M. (2018) -
Electrical modeling and simulation of nanoscale MOS devices with a high-permittivity dielectric gate stack
Autran, J.L.; Munteanu, D.; Houssa, Michel; Bescond, M.; Garros, X.; Leroux, C. (2004)