Now showing items 1-2 of 2

    • Copper grain growth in reduced dimensions 

      Brongersma, Sywert; Vanstreels, Kris; Wu, W.; Zhang, Wenqi; Ernur, Didem; D'Haen, Jan; Terzieva, Valentina; Van Hove, Marleen; Clarysse, Trudo; Carbonell, Laure; Vandervorst, Wilfried; De Ceuninck, Ward; Maex, Karen (2004-06)
    • Impact of LER and CDU on device performance 

      Leunissen, Peter; Lorusso, Gian; Ercken, Monique; Croon, Jeroen; Jurczak, Gosia; Zhang, Wenqi; Wu, W.; Yang, H.; Azordegan, A.; DiBiase, T. (2005)